For our 2025 Component Abuse Challenge there have been a set of entries which merely use a component for a purpose it wasn’t quite intended, and another which push misuse of a part into ...
Such are the breadth of functions delivered by integrated circuits, it’s now rare to see a simple small-signal transistor ...
Abstract: A vertical pnp BJTs on thin SOI is designed and characterized by using the mixed numerical two-dimensional process and device simulator (Sentaurus). The DC, frequency, and breakdown ...
32 hFE tester This hFE tester is interesting because of its simplicity and because it enables the of both PNP and NPN transistors to be measured. Further- more the measurement is independent of the ...
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