Abstract: With the rapid development of integrated circuit manufacturing processes, soft errors have emerged as a pivotal factor that influences circuit reliability. This paper endeavors to ...
Stale type:bug-suspectedSuspected bug (not working as designed/expected). See type:bug-confirmed for confirmed bugsSuspected bug (not working as designed/expected). See type:bug-confirmed for ...
Abstract: In this paper, the location error of sound location of three-dimensional sound intensity measurement method was researched. Four microphones are used on the ...
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