Machine learning enables real-time analysis of iron oxide thin film growth in reactive magnetron sputtering

Researchers at University of Tsukuba have developed a technology for real-time estimation of the valence state and growth rate of iron oxide thin films during their formation. This novel technology ...
EurekAlert!

Researchers demonstrate new technique for controlling phase boundaries in thin films

Researchers have demonstrated a new technique for precisely controlling phase boundaries in thin film materials by manipulating the thickness of those films – allowing them to engineer energy storage ...
Semiconductor Engineering

Directly Writing and Rewriting Photonic Chips on Low-Loss Phase-Change Thin Films

A technical paper titled “Freeform direct-write and rewritable photonic integrated circuits in phase-change thin films” was published by researchers at University of Washington, University of Maryland ...
Purdue University

Research team publish work on solar cell film phase transitions

WEST LAFAYETTE, Ind. — A Purdue University professor and a multi-institution team of researchers recently published a paper on solar cells in Nature Materials. Letian Dou, an assistant professor in ...
Nanowerk

Ellipsometry for Nanotechnology: Measuring Thin Films

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...