Researchers at University of Tsukuba have developed a technology for real-time estimation of the valence state and growth rate of iron oxide thin films during their formation. This novel technology ...

Researchers have demonstrated a new technique for precisely controlling phase boundaries in thin film materials by manipulating the thickness of those films – allowing them to engineer energy storage ...

A technical paper titled “Freeform direct-write and rewritable photonic integrated circuits in phase-change thin films” was published by researchers at University of Washington, University of Maryland ...

WEST LAFAYETTE, Ind. — A Purdue University professor and a multi-institution team of researchers recently published a paper on solar cells in Nature Materials. Letian Dou, an assistant professor in ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

Discover how KDF is balancing legacy expertise with forward-looking innovation to shape the future of thin-film deposition.

The CuBert paste was used on an M10 solar cell with a conversion efficiency of 24%. Image: Bert Thin Films. Kentucky-based Bert Thin Films has used a proprietary copper paste on a tunnel oxide ...