With the rapid evolution of UAV technology, intelligent power equipment inspection via aerial imagery is critical. To address traditional insulator defect detection bottlenecks (high false/missed ...
In response to the current issue of insufficient multi-scale defect coverage capability in detection networks,we propose a multi-scale fusion MobileMamba network by optimizing the model’s backbone ...
“Semiconductor lithography inspection requires reliable detection of small pattern defects such as bridge, burr, pinch, and contamination. In this study, we propose a two-stage vision-language ...
AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.
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